Detecting Intra-Word Faults in Word-Oriented Memories
نویسندگان
چکیده
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establishes the data background sequence (DBS) for each intraword coupling fault. These DBSs will be compiled into a (1+ 28 blog2Bc) n B test with complete fault coverage of the target faults, where n is the size of the memory and B the word size. The test length can be reduced to 29 n B when the intra-word faults are restricted to physical adjacent cells within a word.
منابع مشابه
Mar h Tests for Word - Oriented Two - Port
Said Hamdioui1;2 A. J. van de Goor2 1Intel Corporation, 2200 Mission College Boulevard, Santa Clara, CA 95052 2Se tion Computer Ar hite ture & Digital Te hnique, Department of Ele tri al Engineering Fa ulty of Information Te hnology and Systems, Delft University of Te hnology Mekelweg 4, 2628 CD Delft, The Netherlands E-mail: (said,vdgoor) ardit.et.tudelft.nl Abstra t This paper presents an app...
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